What’s New in 2013

Tuesday, 01 January 2013 by

Heavy ion radiation model added to v.2013 device simulators (Oct. 4th 2013) A new model has been added to APSYS and our other device simulators to model the effects of a heavy ion hit on device performance. This allows the software to import Linear Energy Transfer (LET) data from third-party software tools such as SRIM/TRIM.