A research article co-authored by Crosslight’s Simon Li has been selected has an Applied Physics Letters Editor’s pick in Device Physics. As a result of this selection, the article may be downloaded for free for a limited time from the APL website.

Are Electron-Blocking Layers Always Beneficial? An APL article co-authored by Crosslight’s Simon Li and Changsheng Xia is featured in Compound Semiconductor magazine. The full text can be found here.

A new book, “Integrated Power Devices and TCAD simulation” is published by CRC press A new book co-authored by Crosslight’s Fred Yue Fu, Simon Li, Prof. W.T. Ng from University of Toronto and Prof. Johnny Sin from Hong Kong University of Science and Technology has been published by CRC press. This book covers a wide